Keyence 3D laser scanning microscope offers high-speed scan mode

Jan. 9, 2012

Combining the capabilities of an optical microscope, profilometer, and SEM, the VK-X 3D laser scanning microscopes are able to perform noncontact profile, roughness, and thickness measurements with a 0.5 nm z-axis resolution. Designed to reduce user error and analysis time, the microscope has a new high-speed scan mode and one-touch automated operation, with no sample preparation needed.
Keyence
Singapore
[email protected]

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PRESS RELEASE

Non-contact Profile and Roughness Measurements on Nearly Any Material.

Combining the capabilities of an optical microscope, profilometer and SEM, the VK-X 3D Laser Scanning Microscopes are able to perform profile, roughness and thickness measurements with an industry-leading 0.5 nm Z-axis resolution. Dramatically reduce user error and analysis time using a new high-speed scan mode and one-touch automated operation – without the need for sample preparation.

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